Reply to Comment on ‘Nondipole Resonant X- ray-Raman Spectroscopy: Polarized Inelastic Scattering at the K Edge of Cl2,’

Nondipole Resonant X-ray-Raman Spectroscopy: Polarized Inelastic Scattering at the K Edge of Cl2

Electronic structure of Ni complexes by X-ray resonance Raman spectroscopy (resonant inelastic X-ray scattering).

The potential of 1s2p resonant inelastic (Raman) X-ray scattering (RIXS) is demonstrated for a series of Ni coordination complexes. In this technique, incident and scattered photon energies lie in the hard X-ray range (>5 keV). The 1s2p RIXS contour plots provide information that is complementary to K-edge and L-edge spectroscopy. RIXS spectroscopy promises to be a valuable probe of electronic ...

Aluminum Impurities in Silicon: Investigation of X-ray Raman Scattering in Total Reflection X-ray Fluorescence Spectroscopy

Total Reflection X-ray Fluorescence (TXRF) using Synchrotron Radiation from the Stanford Synchrotron Radiation Laboratory (SSRL) has been used to study Al impurities on Si wafer surfaces. For primary excitation energies below the Si K absorption edge an inelastic resonance scattering due to resonant xray Raman scattering is observed. This scattering dominates the background behavior of the Al K...

Reply to comment by Hüfner on "Resonant Inelastic X-Ray Scattering at the Oxygen K Resonance of NiO: Nonlocal Charge Transfer and Double-Singlet Excitations"

Unraveling the nature of charge excitations in La₂CuO₄ with momentum-resolved Cu K-edge resonant inelastic x-ray scattering.

The results of model calculations using exact diagonalization reveal the orbital character of states associated with different Raman loss peaks in Cu K-edge resonant inelastic x-ray scattering (RIXS) from La₂CuO₄. The model includes electronic orbitals necessary to highlight the nonlocal Zhang-Rice singlet, charge transfer, and d-d excitations, as well as states with apical oxygen 2p(z) charact...